Threshold voltage reliability in flexible amorphous In–Ga–ZnO TFTs under simultaneous electrical and mechanical stress

Flexible thin film transistors on 50 µm thick polyimide demonstrated stable behavior under simultaneous mechanical and electrical stress up to a 4 mm bending radius.

File Type: 1088/2058-8585/ac7186
Categories: Scientific Paper
Tags: Direct-writing, DWL 66
Author: Flexible and Printed Electronics
Scroll to Top