Thermal scanning probe lithography – a review

Review of Thermal Scanning Probe Lithography (t-SPL) covering its capabilities for high-resolution nanolithography and material interactions, providing insights for nanofabrication and material science challenges.

File Type: 1038/s41378-019-0124-8
Categories: Scientific Paper
Tags: NanoFrazor, Thermal Scanning Probe (t-SPL)
Author: Heidelberg Instruments, Microsystems & Nanoengineering (nature)
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