Scanning Probe Thermometry to study Thermoelectricity and Dissipation at Nanoscale Junctions

This thesis explores heat transport and dissipation in nanoelectronics using high-resolution scanning probe thermometry, revealing nanoscale thermal phenomena, defects, and thermoelectric effects.

File Type: 11850/387500
Categories: Scientific Paper
Tags: NanoFrazor, Thermal Scanning Probe (t-SPL)
Author: ETH Zürich
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