Oxidation and Thermal Scanning Probe Lithography for High-Resolution Nanopatterning and Nanodevices

Scanning probe lithography (SPL) offers high resolution, precise positioning, and material versatility, but its throughput limitations can be addressed through mix-and-match lithography strategies.

File Type: 1007/978-3-030-15612-1_5
Categories: Scientific Paper
Tags: NanoFrazor, Thermal Scanning Probe (t-SPL)
Author: Electrical Atomic Force Microscopy for Nanoelectronics
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