Liquid metal oxide enables ultrathin high-k HfO2 integration on 2D semiconductors, achieving smooth interfaces, low-leakage WS2 transistors, minimal hysteresis, and scalable dielectric-contact stacking for nanoelectronics.

File Type: 4c08554
Categories: Scientific Paper
Tags: NanoFrazor, Thermal Scanning Probe (t-SPL)
Author: ACS Nano
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