Far-Field and Non-Intrusive Optical Mapping of Nanoscale Structures

This study analyzes far-field optical mapping of nanostructures using CLSM and radially polarized light, achieving 74 nm resolution for LDOS, crucial for high-density optical storage.

File Type: www
Categories: Scientific Paper
Tags: NanoFrazor, Thermal Scanning Probe (t-SPL)
Author: Nanomaterials
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