Edge-Contact MoS2 Transistors Fabricated Using Thermal Scanning Probe Lithography

Thermal scanning probe lithography (t-SPL) fabricates MoS2-based field-effect transistors, achieving high on/off ratios without damaging materials, offering a gentle alternative to electron beam lithography.

File Type: 2c10150
Categories: Scientific Paper
Tags: NanoFrazor, Thermal Scanning Probe (t-SPL)
Author: ACS Applied Materials & Interfaces
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