Direct Patterning of Metal Chalcogenide Semiconductor Materials

A low-cost, high-resolution direct patterning method using metal-organic precursors enables fabrication of 2D/3D semiconductor structures with sub-50 nm resolution for various nanodevices.

File Type: 202002685
Categories: Scientific Paper
Tags: NanoFrazor, Thermal Scanning Probe (t-SPL)
Author: Advanced Functional Materials
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