Deterministic grayscale nanotopography to engineer mobilities in strained MoS2 FETs

Engineered nanotopography induces tensile strain in MoS2 FETs, significantly enhancing carrier mobility and on-state current, promising advancements for 2D material-based electronics.

File Type: www
Categories: Scientific Paper
Tags: NanoFrazor, Thermal Scanning Probe (t-SPL)
Author: nature communications
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