Defect-engineered β-Bi2SeO5/Bi2O2Se heterojunctions suppress vacancies, enable type-II charge separation, and achieve high-responsivity phototransistors and high-resolution arrays for advanced optoelectronics.

File Type: 202517425
Categories: Scientific Paper
Tags: NanoFrazor, Thermal Scanning Probe (t-SPL)
Author: Advanced Materials
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